Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...

Understand why testing must evolve beyond deterministic checks to assess fairness, accountability, resilience and ...

A unique investment from the quant trading giant signals a shift in how complex systems will be tested. Software systems have grown more complex, and as AI accelerates the volume of code being ...

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

To view a PDF version of this article, click here. To maintain test quality, designers must continually update or replace their DFT techniques. While this applies across the board, DFT for ...

Semiconductor testing is undergoing multiple paradigm changes at once with the common goals of producing more known good die per month with low test cost. Achieving these goals requires a delicate ...

Testing APIs and applications was challenging in the early devops days. As teams sought to advance their CI/CD pipelines and support continuous deployment, test automation platforms gained popularity, ...

A unique investment from the quant trading giant signals a shift in how complex systems will be tested. TYSONS CORNER, Va., Dec. 3, 2025 /PRNewswire/ -- Antithesis today announced a $105 million ...